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Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing 2000 edition
Benoit Nadeau-dostie
Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing 2000 edition
Benoit Nadeau-dostie
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.
239 pages, biography
Media | Books Hardcover Book (Book with hard spine and cover) |
Released | September 30, 1999 |
ISBN13 | 9780792386698 |
Publishers | Springer |
Pages | 239 |
Dimensions | 178 × 254 × 15 mm · 653 g |
Language | English |
Editor | Nadeau-Dostie, Benoit |
See all of Benoit Nadeau-dostie ( e.g. Hardcover Book and Paperback Book )