Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science - Jose Pineda de Gyvez - Books - Springer - 9780792393061 - December 31, 1992
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Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science 1993 edition

Jose Pineda de Gyvez

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Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science 1993 edition

The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

167 pages, 48 black & white illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 31, 1992
ISBN13 9780792393061
Publishers Springer
Pages 167
Dimensions 155 × 235 × 12 mm   ·   453 g
Language English  

See all of Jose Pineda de Gyvez ( e.g. Hardcover Book and Paperback Book )