Hot-carrier Reliability of Mos Vlsi Circuits - the Springer International Series in Engineering and Computer Science - Yusuf Leblebici - Books - Springer-Verlag New York Inc. - 9781461364290 - September 27, 2012
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Hot-carrier Reliability of Mos Vlsi Circuits - the Springer International Series in Engineering and Computer Science Softcover Reprint of the Original 1st Ed. 1993 edition

Yusuf Leblebici

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Hot-carrier Reliability of Mos Vlsi Circuits - the Springer International Series in Engineering and Computer Science Softcover Reprint of the Original 1st Ed. 1993 edition

229 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 27, 2012
ISBN13 9781461364290
Publishers Springer-Verlag New York Inc.
Pages 229
Dimensions 155 × 235 × 13 mm   ·   335 g
Language English  

See all of Yusuf Leblebici ( e.g. Hardcover Book and Paperback Book )