Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Materials Characterization and Analysis Collection - Fred Stevie - Books - Momentum Press - 9781606505885 - September 15, 2015
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Fred Stevie
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Materials Characterization and Analysis Collection

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150 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 15, 2015
ISBN13 9781606505885
Publishers Momentum Press
Pages 150
Dimensions 152 × 229 × 16 mm   ·   390 g
Language English  

See all of Fred Stevie ( e.g. Paperback Book )