Characterisation and Control of Defects in Semiconductors - Materials, Circuits and Devices - - Books - Institution of Engineering and Technolog - 9781785616556 - December 16, 2019
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Characterisation and Control of Defects in Semiconductors - Materials, Circuits and Devices

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Characterisation and Control of Defects in Semiconductors - Materials, Circuits and Devices

This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.

596 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 16, 2019
ISBN13 9781785616556
Publishers Institution of Engineering and Technolog
Pages 596
Dimensions 1.09 kg
Editor Tuomisto, Filip (Professor, University of Helsinki, Department of Physics, Finland)