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Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
Pierre-Richard Dahoo
Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
Pierre-Richard Dahoo
256 pages
Media | Books Hardcover Book (Book with hard spine and cover) |
Released | March 16, 2021 |
ISBN13 | 9781786306401 |
Publishers | ISTE Ltd and John Wiley & Sons Inc |
Pages | 256 |
Dimensions | 10 × 10 × 10 mm · 526 g |
Language | English |