Rf and Microwave Modeling and Measurement Techniques for Field Effect Transistors - Electromagnetics and Radar - Jianjun Gao - Books - SciTech Publishing Inc - 9781891121890 - June 30, 2010
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Rf and Microwave Modeling and Measurement Techniques for Field Effect Transistors - Electromagnetics and Radar

Jianjun Gao

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S$ 190

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Expected delivery Apr 25 - May 9
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Rf and Microwave Modeling and Measurement Techniques for Field Effect Transistors - Electromagnetics and Radar

350 pages, illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released USA, June 30, 2010
ISBN13 9781891121890
Publishers SciTech Publishing Inc
Pages 350
Dimensions 589 g

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