Multi-run Memory Tests for Pattern Sensitive Faults - Ireneusz Mrozek - Books - Springer Nature Switzerland AG - 9783030081980 - February 1, 2019
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Ireneusz Mrozek
Multi-run Memory Tests for Pattern Sensitive Faults Softcover reprint of the original 1st ed. 2019 edition

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This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.

135 pages, 50 Tables, color; 34 Illustrations, black and white; X, 135 p. 34 illus.

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 1, 2019
ISBN13 9783030081980
Publishers Springer Nature Switzerland AG
Pages 135
Dimensions 150 × 220 × 10 mm   ·   454 g
Language German  

See all of Ireneusz Mrozek ( e.g. Paperback Book and Hardcover Book )