Phase Change Memory: Device Physics, Reliability and Applications - - Books - Springer International Publishing AG - 9783319690520 - November 28, 2017
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Phase Change Memory: Device Physics, Reliability and Applications 1st ed. 2018 edition

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This book describes the physics of phase change memory devices, starting from basic operation to reliability issues. The book also contains design engineering details on PCM cell architecture, PCM cell arrays (including electrical circuit management), as well as the full spectrum of possible future applications.

330 pages, 40 Tables, color; 196 Illustrations, color; 24 Illustrations, black and white; XVIII, 330

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 28, 2017
ISBN13 9783319690520
Publishers Springer International Publishing AG
Pages 330
Dimensions 150 × 220 × 20 mm   ·   666 g
Language German  
Editor Redaelli, Andrea

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