Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics - Souvik Mahapatra - Books - Springer, India, Private Ltd - 9788132225072 - August 14, 2015
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics 1st ed. 2015 edition

Souvik Mahapatra

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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics 1st ed. 2015 edition

269 pages, 133 black & white illustrations, 68 colour illustrations, 17 black & white tables, biogra

Media Books     Hardcover Book   (Book with hard spine and cover)
Released August 14, 2015
ISBN13 9788132225072
Publishers Springer, India, Private Ltd
Pages 269
Dimensions 155 × 235 × 20 mm   ·   689 g
Editor Mahapatra, Souvik

See all of Souvik Mahapatra ( e.g. Hardcover Book )