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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics 1st ed. 2015 edition
Souvik Mahapatra
Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics 1st ed. 2015 edition
Souvik Mahapatra
269 pages, 133 black & white illustrations, 68 colour illustrations, 17 black & white tables, biogra
Media | Books Hardcover Book (Book with hard spine and cover) |
Released | August 14, 2015 |
ISBN13 | 9788132225072 |
Publishers | Springer, India, Private Ltd |
Pages | 269 |
Dimensions | 155 × 235 × 20 mm · 689 g |
Editor | Mahapatra, Souvik |
See all of Souvik Mahapatra ( e.g. Hardcover Book )