On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond - Andrej Rumiantsev - Books - River Publishers - 9788770221122 - July 31, 2019
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On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond

Andrej Rumiantsev

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On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond

This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.

250 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released July 31, 2019
ISBN13 9788770221122
Publishers River Publishers
Pages 278
Dimensions 526 g

See all of Andrej Rumiantsev ( e.g. Hardcover Book and Paperback Book )