Electromigration in Thin Films and Electronic Devices: Materials and Reliability - Woodhead Publishing Series in Electronic and Optical Materials - Choong-Un Kim - Books - Elsevier Science & Technology - 9780081016961 - September 11, 2011
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Choong-Un Kim
Electromigration in Thin Films and Electronic Devices: Materials and Reliability - Woodhead Publishing Series in Electronic and Optical Materials

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352 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 11, 2011
Original release date 2016
ISBN13 9780081016961
Publishers Elsevier Science & Technology
Pages 352
Dimensions 150 × 220 × 10 mm   ·   494 g
Editor Kim, Choong-Un (University of Texas at Arlington, USA)

See all of Choong-Un Kim ( e.g. Paperback Book )