Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing - Adam Osseiran - Books - Springer - 9780792386865 - October 31, 1999
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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing 1999 edition

Adam Osseiran

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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing 1999 edition

Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed.

156 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 31, 1999
ISBN13 9780792386865
Publishers Springer
Pages 156
Dimensions 156 × 234 × 11 mm   ·   426 g
Editor Osseiran, Adam
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