Electrical Characterization of Silicon-on-insulator Materials and Devices - the Springer International Series in Engineering and Computer Science - Sorin Cristoloveanu - Books - Kluwer Academic Publishers - 9780792395485 - June 30, 1995
In case cover and title do not match, the title is correct

Electrical Characterization of Silicon-on-insulator Materials and Devices - the Springer International Series in Engineering and Computer Science 1995 edition

Sorin Cristoloveanu

Price
₪ 682
excl. VAT

Ordered from remote warehouse

Expected delivery Nov 21 - Dec 3
Christmas presents can be returned until 31 January

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

Electrical Characterization of Silicon-on-insulator Materials and Devices - the Springer International Series in Engineering and Computer Science 1995 edition

Describes a variety of electrical characterization methods, from wafer screening and defect identification to detailed device evaluation. This book provides a comprehensive treatment of different aspects of SOI technologies, including material synthesis, device physics, characterization, circuit applications, and reliability issues.

396 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 30, 1995
ISBN13 9780792395485
Publishers Kluwer Academic Publishers
Pages 396
Dimensions 156 × 234 × 22 mm   ·   734 g
Language English  
Show all

More by Sorin Cristoloveanu

See all of Sorin Cristoloveanu ( e.g. Hardcover Book and Paperback Book )