Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices - - Books - Institution of Engineering and Technolog - 9780863417450 - May 30, 2008
In case cover and title do not match, the title is correct

Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices

Price
HK$ 1,049
excl. VAT

Ordered from remote warehouse

Expected delivery Jul 9 - 22

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.

408 pages, Illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released May 30, 2008
ISBN13 9780863417450
Publishers Institution of Engineering and Technolog
Pages 408
Dimensions 159 × 232 × 23 mm   ·   612 g
Editor Sun, Yichuang