Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing - Kumar, Ch Sateesh (University of Johannesburg, South Africa) - Books - Taylor & Francis Ltd - 9781032375113 - November 29, 2024
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing

Kumar, Ch Sateesh (University of Johannesburg, South Africa)

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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

130 pages, 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 29, 2024
ISBN13 9781032375113
Publishers Taylor & Francis Ltd
Pages 130
Dimensions 234 × 156 × 11 mm   ·   238 g
Language English  
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