Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing - Kumar, Ch Sateesh (University of Johannesburg, South Africa) - Books - Taylor & Francis Ltd - 9781032375113 - November 29, 2024
In case cover and title do not match, the title is correct

Kumar, Ch Sateesh (University of Johannesburg, South Africa)
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing

Price
Ft 19,939
excl. VAT

Ordered from remote warehouse

Expected delivery Nov 27 - Dec 8
Christmas presents can be returned until 31 January

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

130 pages, 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 29, 2024
ISBN13 9781032375113
Publishers Taylor & Francis Ltd
Pages 130
Dimensions 234 × 156 × 11 mm   ·   238 g
Language English  
Show all

More by Kumar, Ch Sateesh (University of Johannesburg, South Africa)

See all of Kumar, Ch Sateesh (University of Johannesburg, South Africa) ( e.g. Hardcover Book and Paperback Book )