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Digital Noise Monitoring of Defect Origin - Lecture Notes in Electrical Engineering Softcover reprint of hardcover 1st ed. 2007 edition
Telman Aliev
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Digital Noise Monitoring of Defect Origin - Lecture Notes in Electrical Engineering Softcover reprint of hardcover 1st ed. 2007 edition
Telman Aliev
This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise.
224 pages, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | November 24, 2010 |
| ISBN13 | 9781441944108 |
| Publishers | Springer-Verlag New York Inc. |
| Pages | 224 |
| Dimensions | 155 × 235 × 12 mm · 335 g |
| Language | English |
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