Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing - Mohammad Tehranipoor - Books - Springer-Verlag New York Inc. - 9781441945136 - November 23, 2010
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Mohammad Tehranipoor
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2008 edition

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Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.

422 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 23, 2010
ISBN13 9781441945136
Publishers Springer-Verlag New York Inc.
Pages 408
Dimensions 155 × 235 × 21 mm   ·   589 g
Language English  
Editor Tehranipoor, Mohammad
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