
Tell your friends about this item:
Soft Errors in Modern Electronic Systems - Frontiers in Electronic Testing 2011 edition
Michael Nicolaidis
Soft Errors in Modern Electronic Systems - Frontiers in Electronic Testing 2011 edition
Michael Nicolaidis
Provides a comprehensive presentation of the research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, and more.
336 pages, biography
Media | Books Hardcover Book (Book with hard spine and cover) |
Released | September 30, 2010 |
ISBN13 | 9781441969927 |
Publishers | Springer-Verlag New York Inc. |
Pages | 318 |
Dimensions | 155 × 235 × 19 mm · 644 g |
Language | English |
Editor | Nicolaidis, Michael |
More by Michael Nicolaidis
See all of Michael Nicolaidis ( e.g. Paperback Book and Hardcover Book )