Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science - Jose Pineda de Gyvez - Books - Springer-Verlag New York Inc. - 9781461363835 - February 23, 2014
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Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1993 edition

Jose Pineda de Gyvez

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Integrated Circuit Defect-Sensitivity: Theory and Computational Models - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1993 edition

The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

191 pages, 48 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 23, 2014
ISBN13 9781461363835
Publishers Springer-Verlag New York Inc.
Pages 167
Dimensions 155 × 235 × 11 mm   ·   281 g
Language English  

See all of Jose Pineda de Gyvez ( e.g. Hardcover Book and Paperback Book )