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Quantitative X-Ray Diffractometry Lev S. Zevin Softcover reprint of the original 1st ed. 1995 edition
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Quantitative X-Ray Diffractometry
Lev S. Zevin
One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases.
398 pages, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | December 27, 2011 |
| ISBN13 | 9781461395379 |
| Publishers | Springer-Verlag New York Inc. |
| Pages | 372 |
| Dimensions | 170 × 244 × 20 mm · 630 g |
| Language | English |
| Editor | Mureinik, Inez |
See all of Lev S. Zevin ( e.g. Paperback Book )