High Quality Test Pattern Generation and Boolean Satisfiability - Stephan Eggersgluss - Books - Springer-Verlag New York Inc. - 9781489988478 - October 20, 2014
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High Quality Test Pattern Generation and Boolean Satisfiability 2012 edition

Stephan Eggersgluss

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High Quality Test Pattern Generation and Boolean Satisfiability 2012 edition

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

193 pages, 52 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 20, 2014
ISBN13 9781489988478
Publishers Springer-Verlag New York Inc.
Pages 193
Dimensions 155 × 235 × 11 mm   ·   303 g
Language English  
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