Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization - Materials Characterization and Analysis Collection - Harland G. Tompkins - Books - Momentum Press - 9781606507278 - December 16, 2015
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Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization - Materials Characterization and Analysis Collection

Harland G. Tompkins

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Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization - Materials Characterization and Analysis Collection

178 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 16, 2015
ISBN13 9781606507278
Publishers Momentum Press
Pages 178
Dimensions 267 g
Language English  

See all of Harland G. Tompkins ( e.g. Paperback Book )