Cross-Layer Reliability of Computing Systems - Materials, Circuits and Devices - Giorgio Di Natale - Books - Institution of Engineering and Technolog - 9781785617973 - October 22, 2020
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Cross-Layer Reliability of Computing Systems - Materials, Circuits and Devices

Giorgio Di Natale

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Cross-Layer Reliability of Computing Systems - Materials, Circuits and Devices

This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. It is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing systems.

328 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 22, 2020
ISBN13 9781785617973
Publishers Institution of Engineering and Technolog
Pages 328
Dimensions 156 × 234 × 20 mm   ·   703 g
Language English  
Editor Bosio, Alberto (Full Professor, Ecole Centrale de Lyon - INL, France)
Editor Canal, Ramon (Associate Professor, Universitat Politecnica de Catalunya-Barcelona Tech (UPC), Facultat d'Informatica de Barcelona, Catalonia, Spain)
Editor Carlo, Stefano Di (Tenured Associate Professor, Politecnico di Torino, Italy)
Editor Gizopoulos, Dimitris (Professor, National and Kapodistrian University of Athens, Department of Informatics & Telecommunications, Greece)
Editor Natale, Giorgio Di (Director of Research, National Research Center of France, TIMA Laboratory, Grenoble, France)

See all of Giorgio Di Natale ( e.g. Hardcover Book )