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Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method
Pierre-Richard Dahoo
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Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method
Pierre-Richard Dahoo
288 pages
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | April 6, 2021 |
| ISBN13 | 9781786306876 |
| Publishers | ISTE Ltd and John Wiley & Sons Inc |
| Pages | 288 |
| Dimensions | 10 × 10 × 10 mm · 562 g |
| Language | English |
