Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques - Behnam Ghavami - Books - Springer Nature Switzerland AG - 9783030516093 - October 14, 2020
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Behnam Ghavami
Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques 2021 edition

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Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimationand GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

114 pages, 50 Tables, color; 9 Illustrations, color; 30 Illustrations, black and white; XIII, 114 p.

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 14, 2020
ISBN13 9783030516093
Publishers Springer Nature Switzerland AG
Pages 114
Dimensions 150 × 220 × 20 mm   ·   362 g
Language German  

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