Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics - Peter Pichler - Books - Springer Verlag GmbH - 9783211206874 - June 2, 2004
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Peter Pichler
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics 2004 edition

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This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon.

554 pages, 40 black & white illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 2, 2004
ISBN13 9783211206874
Publishers Springer Verlag GmbH
Pages 554
Dimensions 178 × 254 × 31 mm   ·   1.18 kg
Language English   German  

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