Tell your friends about this item:
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM 2nd ed. 2016 edition
R.F. Egerton
Price
R$ 555.90
excl. VAT
Ordered from remote warehouse
Expected delivery Aug 19 - 29
Our customers say:
Add to your iMusic wish list
Also available as:
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM 2nd ed. 2016 edition
R.F. Egerton
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
207 pages, 109 black & white illustrations, 15 colour illustrations, biography
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | July 7, 2016 |
| ISBN13 | 9783319398761 |
| Publishers | Springer International Publishing AG |
| Pages | 196 |
| Dimensions | 165 × 243 × 22 mm · 471 g |
| Language | German |
![Cover for R.F. Egerton · Electron Energy-Loss Spectroscopy in the Electron Microscope (Paperback Book) [3rd ed. 2011 edition] (2014)](https://imusic.b-cdn.net/images/item/original/498/9781489986498.jpg?r-f-egerton-2014-electron-energy-loss-spectroscopy-in-the-electron-microscope-paperback-book&class=scaled&v=1539963116)
![Cover for R.F. Egerton · Electron Energy-Loss Spectroscopy in the Electron Microscope (Hardcover Book) [3rd ed. 2011 edition] (2011)](https://imusic.b-cdn.net/images/item/original/827/9781441995827.jpg?r-f-egerton-2011-electron-energy-loss-spectroscopy-in-the-electron-microscope-hardcover-book&class=scaled&v=1544993799)