Fundamentals of Electromigration-Aware Integrated Circuit Design - Jens Lienig - Books - Springer International Publishing AG - 9783319735573 - March 7, 2018
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Fundamentals of Electromigration-Aware Integrated Circuit Design 2018 edition

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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.


159 pages, 95 Illustrations, color; 4 Illustrations, black and white; XIII, 159 p. 99 illus., 95 ill

Media Books     Hardcover Book   (Book with hard spine and cover)
Released March 7, 2018
ISBN13 9783319735573
Publishers Springer International Publishing AG
Pages 159
Dimensions 241 × 166 × 12 mm   ·   434 g
Language German  

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