Multi-run Memory Tests for Pattern Sensitive Faults - Ireneusz Mrozek - Books - Springer International Publishing AG - 9783319912035 - July 18, 2018
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Multi-run Memory Tests for Pattern Sensitive Faults 1st ed. 2019 edition

Ireneusz Mrozek

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Multi-run Memory Tests for Pattern Sensitive Faults 1st ed. 2019 edition

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.

135 pages, 50 Tables, color; 34 Illustrations, black and white; X, 135 p. 34 illus.

Media Books     Hardcover Book   (Book with hard spine and cover)
Released July 18, 2018
ISBN13 9783319912035
Publishers Springer International Publishing AG
Pages 135
Dimensions 454 g
Language French  

See all of Ireneusz Mrozek ( e.g. Paperback Book and Hardcover Book )