Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics - Otwin Breitenstein - Books - Springer International Publishing AG - 9783319998244 - January 22, 2019
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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics Third Edition 2018 edition

Otwin Breitenstein

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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics Third Edition 2018 edition

Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems.

321 pages, 68 Illustrations, color; 55 Illustrations, black and white; XVIII, 321 p. 123 illus., 68

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 22, 2019
ISBN13 9783319998244
Publishers Springer International Publishing AG
Pages 321
Dimensions 657 g
Language German  

See all of Otwin Breitenstein ( e.g. Hardcover Book and Paperback Book )