Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science - Stefan Rein - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540253037 - June 23, 2005
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science 2005 edition

Stefan Rein

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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science 2005 edition

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.

492 pages, 29 black & white tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 23, 2005
ISBN13 9783540253037
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 492
Dimensions 241 × 166 × 37 mm   ·   839 g
Language English   German  
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