Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics - Otwin Breitenstein - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642024160 - September 5, 2010
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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics 2nd ed. 2010 edition

Otwin Breitenstein

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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics 2nd ed. 2010 edition

This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

250 pages, 56 black & white illustrations, 33 colour illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 5, 2010
ISBN13 9783642024160
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 258
Dimensions 155 × 235 × 20 mm   ·   498 g
Language French  

See all of Otwin Breitenstein ( e.g. Hardcover Book and Paperback Book )