Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science - Stefan Rein - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642064531 - October 19, 2010
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science Softcover reprint of hardcover 1st ed. 2005 edition

Stefan Rein

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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science Softcover reprint of hardcover 1st ed. 2005 edition

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.

492 pages, 29 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 19, 2010
ISBN13 9783642064531
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 492
Dimensions 155 × 235 × 26 mm   ·   721 g
Language English  
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