Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics - Peter Pichler - Books - Springer Verlag GmbH - 9783709172049 - November 1, 2012
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Peter Pichler
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics Softcover reprint of the original 1st ed. 2004 edition

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This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon.

554 pages, 40 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 1, 2012
ISBN13 9783709172049
Publishers Springer Verlag GmbH
Pages 554
Dimensions 178 × 254 × 30 mm   ·   1.01 kg
Language English  

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