Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics - - Books - Springer, India, Private Ltd - 9788132234241 - October 23, 2016
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics Softcover reprint of the original 1st ed. 2016 edition

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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics Softcover reprint of the original 1st ed. 2016 edition

269 pages, 17 Tables, black and white; 67 Illustrations, color; 134 Illustrations, black and white;

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 23, 2016
ISBN13 9788132234241
Publishers Springer, India, Private Ltd
Pages 269
Dimensions 493 g
Editor Mahapatra, Souvik