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Test Generation of Crosstalk Delay Faults in VLSI Circuits 1st ed. 2019 edition
Jayanthy
Test Generation of Crosstalk Delay Faults in VLSI Circuits 1st ed. 2019 edition
Jayanthy
The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.
156 pages, 30 Tables, color; 7 Illustrations, color; 42 Illustrations, black and white; XI, 156 p. 4
Media | Books Book |
Released | October 10, 2018 |
ISBN13 | 9789811324925 |
Publishers | Springer Verlag, Singapore |
Pages | 156 |
Dimensions | 424 g |
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