Test Generation of Crosstalk Delay Faults in VLSI Circuits - Jayanthy - Books - Springer Verlag, Singapore - 9789811324925 - October 10, 2018
In case cover and title do not match, the title is correct

Test Generation of Crosstalk Delay Faults in VLSI Circuits 1st ed. 2019 edition

Jayanthy

Price
R$ 871.90
excl. VAT

Ordered from remote warehouse

Expected delivery Aug 18 - 28

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Test Generation of Crosstalk Delay Faults in VLSI Circuits 1st ed. 2019 edition

The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.

156 pages, 30 Tables, color; 7 Illustrations, color; 42 Illustrations, black and white; XI, 156 p. 4

Media Books     Book
Released October 10, 2018
ISBN13 9789811324925
Publishers Springer Verlag, Singapore
Pages 156
Dimensions 424 g

See all of Jayanthy ( e.g. Book )