Delay Fault Testing for VLSI Circuits - Frontiers in Electronic Testing - Angela Krstic - Books - Springer - 9780792382959 - October 31, 1998
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Delay Fault Testing for VLSI Circuits - Frontiers in Electronic Testing 1998 edition

Angela Krstic

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Delay Fault Testing for VLSI Circuits - Frontiers in Electronic Testing 1998 edition

In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

191 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 31, 1998
ISBN13 9780792382959
Publishers Springer
Pages 191
Dimensions 155 × 235 × 12 mm   ·   476 g
Language English  

See all of Angela Krstic ( e.g. Hardcover Book and Paperback Book )