Delay Fault Testing for VLSI Circuits - Frontiers in Electronic Testing - Angela Krstic - Books - Springer-Verlag New York Inc. - 9781461375616 - October 12, 2012
In case cover and title do not match, the title is correct

Delay Fault Testing for VLSI Circuits - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 1998 edition

Angela Krstic

Price
R 2,853
excl. VAT

Ordered from remote warehouse

Expected delivery Aug 6 - 18

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

Delay Fault Testing for VLSI Circuits - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 1998 edition

In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

191 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 12, 2012
Original release date 1998
ISBN13 9781461375616
Publishers Springer-Verlag New York Inc.
Pages 191
Dimensions 155 × 235 × 11 mm   ·   299 g
Language English  

See all of Angela Krstic ( e.g. Hardcover Book and Paperback Book )