Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing - Kumar, Ch Sateesh (University of Johannesburg, South Africa) - Books - Taylor & Francis Ltd - 9781032375106 - May 4, 2023
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Kumar, Ch Sateesh (University of Johannesburg, South Africa)
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing

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The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

191 pages, 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black

Media Books     Hardcover Book   (Book with hard spine and cover)
Released May 4, 2023
ISBN13 9781032375106
Publishers Taylor & Francis Ltd
Pages 130
Dimensions 241 × 161 × 14 mm   ·   346 g
Language English  
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