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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM 2nd ed. 2016 edition
R.F. Egerton
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM 2nd ed. 2016 edition
R.F. Egerton
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
207 pages, 109 black & white illustrations, 15 colour illustrations, biography
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | July 7, 2016 |
| ISBN13 | 9783319398761 |
| Publishers | Springer International Publishing AG |
| Pages | 196 |
| Dimensions | 165 × 243 × 22 mm · 471 g |
| Language | German |
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