Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM - R.F. Egerton - Books - Springer International Publishing AG - 9783319819860 - May 30, 2018
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R.F. Egerton
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM Softcover reprint of the original 2nd ed. 2016 edition

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.

196 pages, 15 Illustrations, color; 109 Illustrations, black and white; XI, 196 p. 124 illus., 15 il

Media Books     Paperback Book   (Book with soft cover and glued back)
Released May 30, 2018
ISBN13 9783319819860
Publishers Springer International Publishing AG
Pages 196
Dimensions 234 × 156 × 16 mm   ·   334 g
Language German  
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