Tell your friends about this item:
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM Softcover reprint of the original 2nd ed. 2016 edition
R.F. Egerton
Price
S$ 83.50
excl. VAT
Ordered from remote warehouse
Expected delivery Aug 19 - 29
Our customers say:
Add to your iMusic wish list
Also available as:
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM Softcover reprint of the original 2nd ed. 2016 edition
R.F. Egerton
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
196 pages, 15 Illustrations, color; 109 Illustrations, black and white; XI, 196 p. 124 illus., 15 il
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | May 30, 2018 |
| ISBN13 | 9783319819860 |
| Publishers | Springer International Publishing AG |
| Pages | 196 |
| Dimensions | 234 × 156 × 16 mm · 324 g |
| Language | German |
![Cover for R.F. Egerton · Electron Energy-Loss Spectroscopy in the Electron Microscope (Paperback Book) [3rd ed. 2011 edition] (2014)](https://imusic.b-cdn.net/images/item/original/498/9781489986498.jpg?r-f-egerton-2014-electron-energy-loss-spectroscopy-in-the-electron-microscope-paperback-book&class=scaled&v=1539963116)
![Cover for R.F. Egerton · Electron Energy-Loss Spectroscopy in the Electron Microscope (Hardcover Book) [3rd ed. 2011 edition] (2011)](https://imusic.b-cdn.net/images/item/original/827/9781441995827.jpg?r-f-egerton-2011-electron-energy-loss-spectroscopy-in-the-electron-microscope-hardcover-book&class=scaled&v=1544993799)